VOICE 2017 Set to Kick Off this Month in Palm Springs and Shanghai – Technical Program Details Now Available for Both Venues

VOICE, the annual developer conference hosted by Advantest Corporation, will kick off its second decade on May 16-17 at the Hyatt Regency Indian Wells Resort & Spa in Palm Springs, Calif. The conference will again be held in dual locations, with the U.S. event being followed by VOICE China on May 26, at the Intercontinental Shanghai Pudong in Shanghai.

With a record number of technical presentations, an expanded Technology Kiosk Showcase, and a new technology track, this year’s program is shaping up to be the most exciting yet. The dual-venue VOICE 2017 agenda includes three diverse keynote speakers, a Partners’ Expo, and interactive discussion sessions for users of the V93000 and T2000 system-on-chip (SoC) test platforms, as well as Advantest test cell solutions.

This year’s technical program features a roster of papers from Advantest’s worldwide customers, partners and employees, all presenting insights and best practices. Technical topics will cover device-specific testing, hardware design and integration, improving throughput, reducing time-to-market, new hardware/software test solutions, test methodologies, product engineering, hot topics in the ATE industry, and — for the first time – SmarTEST 8.0 for the V93000 platform. At both events, additional topics will be spotlighted in technical kiosks staffed by Advantest R&D, industry experts and technologists. The kiosks at VOICE China are expected to reach record numbers this year.

In addition to the rich technical content, VOICE 2017 features exciting keynote speeches each morning. The Palm Springs event will get underway with a talk by Advantest’s own Hans-Juergen Wagner, senior vice president of the SoC product group. His presentation, “The Future Trends for and Contributions of Test in the SoC Market,” will detail the drivers, challenges and emerging trends of SoC device designs and their impact on test. The second day’s keynote speaker will be former Federal Bureau of Investigation (FBI) special agent Chris Tarbell, one of the Bureau’s most successful cyber security law enforcement officials of all time. His must-attend presentation sheds light on information too sensitive for print. In Shanghai, Dr. Peter Chen, senior director of China business development at TSMC China Company Limited, will share his insights into the global semiconductor industry landscape, technology trends, and especially the ecosystem and market in China.

Opportunities for face-to-face interaction will be available at various networking activities, including a don’t-miss evening event in the Enchanted Desert near the San Andreas Fault Line in Palm Springs. In addition, a Partners’ Expo will be held in both Palm Springs and China for sponsors to showcase their advanced solutions related to semiconductor testing.

To register for the U.S. event, go to https://voice.advantest.com/register. Online registration closes May 11. On-site registration is available at an increased fee.

Those interested in attending the VOICE China event should email mktgcomms@advantest.com for more information. The presentations in China will be in Mandarin Chinese.

Follow us at #VOICE2017 on Twitter @Advantest_ATE

SEMICON JAPAN 2016 – Advantest Ushers in a New Era of IoT Solutions

Advantest showcased an innovative booth in celebration of SEMICON Japan’s 40th anniversary during SEMICON Japan, held December 14-16, 2016.  Inspired by the Internet of Things (IoT) theme, Advantest’s booth was divided into the four segments of IoT:  Connected Homes, Connected Automobiles, Industrial, and Wireless.  Showcasing 19 of its products and services, the displays included several interactive demonstrations that incorporated virtual reality and augmented reality techniques, as well as mock-up system displays. The interactivity of the booth attracted quite a lot of attention from visitors including customers, partners and media.

In addition, Advantest received two awards at the SEMI President’s reception.  The first was presented to former President and CEO Shinichiro Kuroe for his many years of support and participation at SEMICON Japan, and the second award was presented to Chairman Toshio Maruyama for his significant contributions to the fields of sales and marketing throughout his career in the semiconductor industry.   

Advantest also participated in the technical program with a presentation in the Connected Automobile area delivered by Shin’ichi Kimura, Vice President, ASD Test Business Group. Overall, SEMICON Japan 2016 drew over 64,000 attendees.

Opening day of SEMICON Japan 2016

The booth featured 19 products and services

Advantest Opens Registration for the VOICE 2017 Developer Conference with the Theme of “Measure the Connected World and Everything in It”

Advantest opened registration to attend its VOICE 2017 Developer Conference being held in Palm Springs, California, on May 16-17 and Shanghai, China, on May 26. As VOICE kicks off its second decade, both conferences will feature the theme “Measure the Connected World and Everything in It.”

This theme is a guiding principle that reflects Advantest’s company-wide commitment to test, measure, analyze and report on the most critical performance parameters of the smart semiconductor devices that enable the ever-expanding Internet of Things (IoT). Advantest’s technologies touch all ICs that enable today’s interconnected world, helping to improve the ways people communicate, conduct business, access entertainment, manage life, and more.

At VOICE 2017, attendees will have access to wide-ranging learning and networking opportunities, including general sessions, social events and technical presentations focused on eight topic areas (hot topics, device-specific testing, hardware design and integration, improving throughput, reducing time-to-market, new hardware/software test solutions, test methodologies, and product engineering). Additionally, the conference will showcase its sponsor partners in a special Expo area, and the VOICE Technology Kiosk Showcase will expand to include more interactive discussion sessions in both locations.

The general session in Palm Springs will feature a keynote on Cyber Security by former FBI special agent Chris Tarbell, one of the most successful cyber security law enforcement officials of all time. More program information is available on the VOICE website at https://voice.advantest.com.

Attending VOICE 2017

Online registration is now open at https://voice.advantest.com/register. The 20-percent early bird registration discount for the Palm Springs event ends March 10. Those interested in attending the VOICE China event should email mktgcomms@advantest.com for more information. The presentations in China will be in Mandarin Chinese.

Registered VOICE 2017 attendees are encouraged to make their hotel reservations early. The deadline for the Hyatt Regency Indian Wells Resort & Spa in Palm Springs is April 14, 2017. Additional hotel information for both venues is available on the VOICE website at https://voice.advantest.com/hotel-reservations.

Visit VOICE 2017

Advantest Promotes Newest Test Solutions at Technical Kiosks During Semicon Taiwan

Advantest marked the occasion of Semicon Taiwan to host a two-day hospitality event at which customers were invited to learn about the company’s new products and solutions while networking and enjoying refreshments in a relaxed setting.   With solid attendance on both days, this year’s event recorded the highest level of participation of the event’s five-year history.

Product kiosks within the suite included those focused on:

-Smart Testing of Smart Devices

V93000 AVI64 Universal Analog Pin

-Delivering Revolutionary Test Capabilities for the Next Wave

NEW V93000 Wave Scale Solution

-Testing Memory Devices and SSD UFS

T5800, T5830 and T5851 Testers

-Fully-Integrated Digital IC Test Solution

EVA100 Tester

-Test Floor Intelligence Solutions

Field Service Capabilities

-High Resolution TDR for Failure Analysis

TS9000 TDR option utilizing terahertz technology

Advantest Explores the Internet of Things at SEMICON Japan

At the upcoming SEMICON Japan trade show in Tokyo on December 14-16, Advantest will bring the concept of Internet of Things (IoT) directly into our exhibit.  The value of our products and what we enable will be the platform for how the products will be shown in the booth.  Our products and services will be sorted into these four IoT segments: Industrial, Connected Home, Wireless/Wearables, and Connected Automobile.  In addition to over 18 products and services featured in the booth, we plan to have more hardware and live demonstrations for each of these products than in previous shows.

Further, we are utilizing more cutting-edge technology to demonstrate our products including an interactive wall that catches the visitor’s motion, transparent glass LED monitors to display product messages, and the use of augmented reality on Apple iPads to creatively display product information.

In addition, as a Gold sponsor of the show we are sponsoring the Autonomous & Connected Car Forum, where Shin Kimura, vice president of the ASD Test and Measurement Business Group, will present Thursday afternoon.

 Learn more about SEMI Japan.

Advantest Plays Key Role in ITC with Extensive Program Participation and Exhibition

At the November 15-17 International Test Conference in Fort Worth, Texas, Advantest will demonstrate both hardware and online test solutions as well as serve on panels and present several papers in ITC’s renowned technical program.

In addition to being a Platinum-level corporate supporter of ITC, Advantest also is a Gold-level sponsor of the IEEE Automotive Reliability and Test Workshop, in conjunction with ITC TestWeek™.On The Exhibit Floor

Advantest will feature demonstrations of its on-demand CloudTesting™ Service and its new EVA100 analog/mixed- signal IC test solution.

The first-of-its-kind CloudTesting Service allows users to access various IP selections whenever needed from Advantest’s web site.  Using this on-demand online service, designers can verify their new silicon at very low cost with no capital investment, set up their own test environment within a few hours and be ready to test when the device arrives from the fab.  At ITC, visitors to the booth can see the desktop test station with a live demonstration of how fast a device can be verified with STIL-generated DFT patterns.  With free tester leasing and moderate repair costs, Advantest’s CloudTesting Service allows customers to avoid and unplanned expenses.

Advantest’s new EVA100 analog/mixed-signal test solution combines a modular architecture with high-voltage and high-precision analog parametric measurement units, providing the flexibility to conduct various measurements over a broad range of analog and mixed-signal devices.  The latest model in the EVA100 product family includes an integrated servo-loop function that delivers the industry’s fastest test time and high precision.  Its 18-bit AD-converter characterization has 20bit linearity DC performance and ultra-low drift/noise source and VREF.  Coupled with a GUI that is highly intuitive, users are able to minimize the time to market for their newest ICs.

Technical Program Participation

In addition to product exhibits, Advantest’s technologists will present several papers within ITC’s revered technical program throughout the three-day conference.  Following is a look at where Advantest’s experts will be heard:

• Dave Armstrong will host a discussion of Advantest’s new HA1000 die-level handler, a cost-efficient test solution for determining known good die (KGD) prior to IC packaging.
• Bob Bartlett will chair Session 5, a special session on “mmWave ATE HVM Technology,” where Roger McAleenan will present on mmWaveATE challenges.
• Dave Armstrong will chair Session 6, a special session on “Heterogeneous Integration Pushing the Test Roadmap,” as well as present a paper in that session titled “Moore’s Law is Done and Heterogeneous Integration is Taking Off.”
• A.T. Sivaram will present a poster co-authored with Xilinx Corporation on “CloudTesting™ Service in Silicon Diagnostics,” which describes an innovative service-oriented test solution for debugging high-end FPGA devices.
• Neils Poulsen along with Alfred Crouch and Jim Johnson of SiliconAid will present a poster titled “Silicon Debug on ATE Using Protocol-Aware JTAG-IJTAG EDA Software Tools.”
• Dave Armstrong along with Gary Maier of IBM will deliver a paper on “Known-Good-Die Test Methods for Large, Thin, High-Power Digital Devices.”
• M. Ishida and T. Kusaka of Advantest along with T. Nakura, N. Terao, R. Ikeno, T. Iizuka and K. Asada of the University of Tokyo will present a paper titled, “Power Supply Impedance Emulation to Eliminate Overkills and Underkills Due to the Impedance Difference Between ATE and Customer Board.”
• T. Nakamura and K. Asami’s paper “Novel Crosstalk Evaluation Method for High-Density Signal Traces Using Clock Waveform Conversion Technique” will also be given.

The four panels held during ITC TestWeek™ will each feature panelists from Advantest.  Dave Armstrong will serve on Panel 1, “The Unknown Unknowns of Test,” while Roger McAleenan will participate on Panel 2, “Phased Array 5G:  Is Test Connected or Disconnected?”  Bob Bartlett will bring his expertise to Panel 3, on test cost reduction, and Holger Engelhard will participate in Panel 4, which looks at ATE today, and where we should be heading.

More information about ITC.