Optimizing the True Cost of Test for SSDs

By Scott West, SSD Marketing Manager for Advantest America, and Mark Webb, Industry Consultant at MKW Ventures

With market analysts forecasting that production of solid-state drives (SSDs) will rise to more than 200 million units per year by 2017, device manufacturers need a reliable, high-volume, cost-efficient test solution to serve this rapidly growing market.

For SSD makers, focusing solely on the cost of test (COT) can be misleading. COT is calculated by dividing a piece of equipment’s purchase price by its throughput. While this is a valuable metric, it provides only a snapshot of one point in the lifetime of a tester.

Look at Total Cost of Ownership

To more accurately gauge the economic performance of a tester over time, SSD manufacturers should look at the total cost of ownership (TCO), which takes into consideration not just an item’s initial price, but also longer term considerations such as operating costs and maintenance. For instance, the expense of load boards and consumable materials, power usage, floor-space requirements and operator costs all factor into TCO.

Other considerations include intangibles such as service and support agreements, the length of cycle times and the turnaround time in procuring spare parts. Even an ATE supplier’s “staying power” can affect TCO. This is because semiconductor manufacturers need reliable equipment suppliers that are guaranteed to be around to help them quickly ramp up capacity when needed, to continually find innovative ways to drive down the cost of test and to develop new test technologies to address tomorrow’s market opportunities.

Maximize Your ROI

Because not all testers are created equal, throughput and productivity levels often vary for different systems. So meeting a chip maker’s throughput needs could require only three testers from one supplier, but four systems from another. For example, a PC-based tester might handle 25,000 to 30,000 I/Os per second when testing SSDs with standard second-generation PCIe interface protocols. However, a high-performance system such as Advantest’s MPT3000 platform, equipped with both address and data accelerators, can test eight SSDs simultaneously. This highly parallel testing translates to 260,000 I/Os per second, a throughput boost that dramatically improves TCO.

Another factor to consider is changing market conditions. While rudimentary PC-based testers may come with a lower initial price point, systems that are optimized for flexibility – with scalable architectures, the versatility to test a wide range of today’s device designs and the forward-looking ability to be reconfigured to meet future needs – will provide significantly better TCO in the long run.

As an example, let’s look at a SSD production facility using PC-based test equipment that is turning out a 50-50 mix of devices with PCIe interfaces and SAS interfaces. If market demand shifts and the company wants to adjust its production to 67 percent PCIe devices and 33 percent SAS products, it would need to purchase and ramp up more PC-based testers to handle the additional PCIe SSDs while idling some of its installed SAS-compatible testers.

Only by using reconfigurable test equipment could the company accommodate the new product mix without buying extra capital equipment, dedicating more floor space and bringing in additional operators. Advantest’s MPT3000 tester can be repurposed quickly and easily by downloading new firmware for SAS, SATA and PCIe protocols, making it the most flexible and extendible single-system test solution for SSDs.

A Future Enabled by Flexible Testing

The MPT3000’s flexibility makes it an especially appealing tool for out-sourced assembly and test (OSAT) foundries, which offer SSD makers the opportunity to avoid capital costs in testing their devices. The OSAT business model is based on testing a wide variety of devices in high volumes for multiple customers so these foundry operations need highly versatile test equipment with true multi-protocol support in a single system. While the OSAT model is well established in testing most semiconductor devices, this approach is a new undertaking for the SSD market. Still, the advent of SSD-focused test foundries has strong potential to shorten the time to market and drive down the cost of test for new SSD products.

Young, fast-growing semiconductor markets are characterized by quick shifts in market demand, which force device manufacturers to be agile enough to quickly re-balance their manufacturing levels for various products. This puts a premium on highly flexible test capabilities. For the high-volume, cost-sensitive SSD market, Advantest’s MPT3000 system provides the optimal solution.

Getting from R&D to IoT with the EVA100

By Anthony Lum, Business Development Manager, Advantest America, Inc.

Figure 1

The Internet of Things (IoT) is one the most ubiquitous technology-related topics these days. It’s become one of the tech buzzwords that transcend discussion in trade publications and blogs, showing up regularly in consumer and business publications as speculation swirls about when, where and to what extent IoT products are being deployed. Currently, the broadest applications for IoT solutions are automotive environments, from which myriad products can be launched and controlled, and household uses, including appliances, lighting and environment controls.

In the semiconductor world, analog integrated circuits (ICs) represent a key aspect of IoT. The need for analog ICs has increased in near direct proportion to the number of smart wireless devices on the market. With IoT device volumes expected to top these numbers, analog ICs will play an even more critically important role due to the higher performance, tighter accuracy and longer reliability that IoT devices require. In addition, analog ICs are essential to the rapid device characterization and fast delivery of customer samples the engineering community demands.

R&D engineers previously addressed these challenges by employing classic rack-and-stack or PXI benchtop instrumentation. These solutions were the best fit because of their broad technical reach. However, time-perishable deliverables proved extremely challenging because R&D engineers faced the additional task of developing system software to control and integrate the non-automated benchtop solutions. This undertaking requires strong coding skills and a more comprehensive knowledge of each of the benchtop instruments’ operation than the engineers typically possess. Manual measurement, on the other hand, is cumbersome and hampers rapid turnaround of deliverables.

Figure 2

One solution that addresses this range of challenges is Advantest’s EVA100 measurement system, whose step-function integration is a significant improvement over classic benchtop instruments. The EVA100’s “all-in-one” concept integrates functions for a hose of instrumentation – power supplies, 4-quadrant DC signal measurement units, pattern generators, logic analyzers, arbitrary waveform generators, digitizers and oscilloscopes – into a single, modular unit. Each of these functions replaces standalone, focused instruments necessary to perform comprehensive evaluation and measurement of linear, automotive and industrial devices. Figure 2 shows how the EVA100 greatly simplifies analog IC device setup and replaces the need for six standalone, classic, benchtop instruments.

The “all-in-one” EVA100, also nicknamed the “shoe-box,” has a small footprint and is lightweight, portable and runs on standard 120V AC – all of which facilitates moving the unit from desktop to desktop, or into the lab as needed. The same hardware and setup can be preserved at any measurement station or node, assuring data acquisition consistency and correlation.

Rapid turnaround can be inhibited by development of complex software. Historically an underscoped task that tends to takes longer than expected to complete, software development is also complex and depends on users’ experience and comfort level. Software development is not needed with the EVA100, thanks to its newly developed, highly intuitive software GUI. With its drag-and-drop operation, the software interface enables engineers to quickly and easily create device-focused measurement set-ups. Automatic report functions dramatically improve deskwork efficiency, providing clear documentation and data ready for publishing in device data sheets.

The EVA100 combines Advantest’s unparalleled ATE and benchtop expertise to synergistically deliver a benchtop-measurement system that is fully modular and delivers benchtop-accuracy hardware along with intuitive GUI software delivering a complete turnkey solution. Priced competitively to benchtop instruments to ensure maximize ROI, the fully integrated EVA100 is often lower priced than an equivalent piecemeal rack or PXI instrument configuration. With software also included as part of the system’s package, the IoT-optimized EVA100 solves the two-pronged challenge of rapid device characterization and high performance quantitative data for a wide range of analog ICs.

About the Author

Anthony Lum joined Advantest America in 2006 and is currently ASD Business Development Manager. He amassed over 25 years of ATE experience specializing in RF and Analog SoC device testing through roles as a test engineer, applications engineer, and test and applications management at Texas Instruments and HP/Agilent. He received his BSEE at Arizona State University in 1986 and has authored over 20 IEEE and industry papers.