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Enabling High Throughput and Low Cost of Test for Analog Baseband Processors

By Mandy Davis, Business Development Manager, Advantest America

Analog baseband processors are communications workhorses. Digital processing streams must be manipulated into analog for amplitude, requiring they be encoded into a form suitable for transmission. The analog baseband processor tackles this encoding, converting the signal before it’s fed into a multiplexer that will place the baseband signal onto a relevant transmission channel.

Because they do so much heavy lifting, analog baseband processors require various types of function blocks. As chip integration has grown higher, so has the required performance for each block, e.g., processing speed of the microprocessor, bandwidth of the converters, etc. Some typical analog IP blocks include Transmit DACs (digital-to-analog converters), Receive ADCs (analog-to-digital converters), Audio DACs and Audio ADCs.

The Wave Scale Mixed-Signal High-Speed (WSMX HS) card, designed for use with the V93000 test platform, is Advantest’s next-generation analog card. Developed to address the requirements of these high-performance devices, the card contains both digitizers and arbitrary waveform generators (AWGs). It’s optimized for the latest baseband modulation schemes and is ready for 4G and 5G communication standards. To provide even more flexibility, WSMX can be used in combination with Advantest’s Wave Scale RF (WSRF) card, digital card, and Device Power Supply (DPS) card to address a broad range of applications, including RF, baseband processors and high-speed DACs and ADCs (see Figure 1).

wavescale-mx

The WSMX card uses the same type of per-pin architecture as the company’s other V93000 channel cards. None of the resources are shared, and all instruments are controlled in parallel and independently by the test processor, enabling faster test times. With 16 units per card that can be used as an AWG or digitizer, WSMX provides up to 32 instruments in a single card. This high density allows for increased multi-site test without requiring more cards to be added – in turn, contributing to lower test costs. Moreover, the card is scalable and licensable for as few as four units or as many as 16; therefore, the user doesn’t need to pay for all of the units if not all are required.

Measurement parameters for the WSMX card are among the best available in the industry, including a sample rate of 500 Megasamples per second (Msps) and bandwidth of up to 200MHz for the AWG, and a sample rate of 250Msps and bandwidth up to 300MHz for the digitizer. The WSMX card also includes a parametric measurement unit (PMU) per pin, for a total of 64 PMUs per card. With its per-pin PMU of ±3mV voltage accuracy and ±20nA current accuracy, the WSMX card provides all the performance necessary for DC measurements. It also includes a built-in flexible I/O matrix, so all functionality is available behind every pogo – each pin can operate as a PMU, AWG, or digitizer.

To summarize, the Wave Scale MX card tests analog baseband interfaces and high-speed DACs and ADCs, utilizing:

  • 32 full independent instruments for true parallel mixed-signal test
  • Test processor-controlled functionality
  • Precise synchronization with all other resources in the tester
  • Very high density with uncompromised mixed-signal test in the smallest infrastructure

As a result, WSMX delivers very high throughput and low test costs, while providing the high performance essential to analog/mixed-signal applications and high degree of scalability and flexibility for which the V93000 test platform is known.

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Posted in Q&A

Spotlight on W2BI: Out of the Lab and into the Field: Making IoT Device Testing Portable

Interview with Artun Kutchuk

W2BI, Inc., an Advantest Group company, is a leading developer of wireless device test automation products designed to improve quality and time-to-market for customers’ advanced mobile devices. GO SEMI & BEYOND sat down with W2BI Vice President of Business Development and Strategy, Artun Kutchuk, to talk about the wireless market’s testing needs, why testing Internet of Things (IoT) devices is a different animal with unique testing requirements, and W2BI’s pioneering new approach to testing in the age of IoT.

Q. What are the testing needs for the wireless market in the next five years?

A. The market will undergo rapid change over the next 24 months, let alone the next five years. We will see a move toward connected and aware test environments leveraging both software-as-a-service (SaaS) and platform-as-a-service (PaaS) models. The pace of testing, communication, and information sharing will speed significantly as the types of information that can be shared between R&D and production line systems increase. Future systems will benefit greatly by sharing information with each other – at the chip level, during design and R&D, certification, and returns.

IoT devices have very important test needs: IoT communication modules that power temperature sensors, agricultural sensors, video systems, control systems, biometrics, and the like. As these are deployed in higher volume and defects appear once they’re embedded, it becomes very difficult and costly to pull them out of their environment. The ability to trace pass/fail from silicon all the way to field deployment will require information sharing across test systems, and we’ll start to see further connection both within and between systems to simplify sharing different types of data.

The industry is now in a great position to leverage major advances in the cloud and bring previously disconnected test environments into the connected world. To achieve this, we needed to establish a new product category of connected portable test systems that will replace disconnected test systems for IoT test.

Q. Why do W2BI’s history and skill set position it well to provide test and measurement solutions for the IoT space?

We have a long history in mobile test – handsets, mobile phones, and similar products popular within the last five to ten years in the consumer space. While all of these are now mature industries, our expertise gives us a platform for moving forward in IoT. We perform both feature- and functional-based test, and we have strong expertise all the way through final assembled test. This allows controlling the device under test (DUT) and putting it under many different test scenarios – using an automated approach – to enable fast, thorough testing. Our customer base also positions us well in the IoT market. We provide solutions to top mobile operators, who approve new devices to go on the network. We also build and deliver systems to OEMs, a number of whom utilize them well for a range of applications.

Q. What is your MicroLTE solution, and why is it uniquely suited to address the IoT test market?

A. In the mobile world, an IoT device is purpose-built for specific functions and could have many different communication bearers.  It’s a very different type of device from a tablet or a smartphone – in cost structure, in usability, and in what you have to test on it. The industry needs a test system that can exercise the needs and requirements of an IoT device as well as the development and test cycles that support commercialization.  Our portable MicroLTE solution achieves several things:

  1. Lowers the cost of test. With large-scale economics, you could have one traditional handset provider buy a test system, and then use it to manufacture millions of smartphones. The IoT market has many more manufacturers and is typically much more purpose-built in final use scenarios. These devices are coming to market in large overall volumes, but smaller model volumes and a different cost structure – requiring a different, more flexible approach.
  2. Allows for a different business model. While traditional test equipment typically employs a capital expenditure (CapEx) model, MicroLTE also allows for an operating expenses (OpEx) model. In the IoT space, your testing needs can change rapidly, so instead of acquiring the system on a CapEx basis, you acquire it through a SaaS/PaaS-type subscription, use it for as long as your program needs, and then provide it back to us. We have built a SaaS/PaaS-based cloud system to allow for this approach.
  3. Delivers test portability. The bench test equipment used in mobile feature and functional test is typically big and heavy, and once it’s installed, you really can’t move it with ease. With MicroLTE, we’ve shrunk the test equipment down to fit into the size of a backpack. This makes it easy to transport between sites and use in unique ways and environments. To create this small footprint, we’ve pulled as much functionality as we can off the equipment and put onto a Microsoft Surface Pro 4 laptop with a touchscreen – it’s very small and simple to use and allows the MicroLTE system to provide a rich and functionally complete LTE system, with eNB, IMS, and EPC. 1 Together, these create a rich, portable LTE test lab that’s very easy to learn and use in any environment.
  4. Managed via the cloud. As soon as the MicroLTE equipment comes online, you can manage it remotely via the MicroLTE Cloud Hub built with security and scale via Microsoft Azure. Traditional test systems today are physically disconnected and only physically secured within the facility. With MicroLTE, you can engage the test system with a strong balance of usability, access, and security. The test user can share data in a controlled and managed way to supporting organizations or enterprises, speeding up the R&D and test cycle to allow for a faster time to market.

This system is uniquely suited to IoT because in the IoT world many of the devices have limited human interfaces, e.g., power meters, temperature controls, irrigation controls, parking meters, etc. Thus, automating the DUT is critical, allowing for as little user interaction as possible with the test environment  – consequently optimizing test automation and speeding the test process. We have an extensive background in device automation and take this to the next level with MicroLTE.

Q. What is W2BI’s cloud vision for the future of IoT and assembled device testing?

A. We wanted to solve a couple of problems. First, as we all know, IoT is fragmented, with billions of devices projected by 2020. We needed to build a system that could provide as much test coverage as possible throughout the product’s lifecycle. Second, we wanted to provide a platform for detailed test data to be communicated to different R&D environments, allowing teams to share information easily and quickly for debug, pass/fail, etc. The cloud is the key to providing new and updated test coverage to many systems in a scalable manner, and for bringing together test data from many geographically separated systems. It allows systems to be securely deployed locally or distributed in multiple global regions. Test data is very sensitive, and a cloud-based system lets the enterprise own its own data and manage security consistent with their policies. One customer we are working with has said this cloud design is by far the most secure test system they have seen.

Q. What type of partners is W2BI seeking to extend MicroLTE to the next version?

A. Our first goal was to partner closely with mobile operators, chip/module makers and OEMs. We selected a group of key chip/module makers for the first round of product trials, and it has gone very well. We have just moved from the first phase of development and commercialization to general availability.

For the next phase, we want to focus on the scale of the system for broad deployment and management, so we’re looking at test partners, test labs, companies in the traditional IT space. This will be determined over the next quarter.

We’re enormously excited about this product – it will serve as a complement to Advantest’s production line ATE products while establishing a unique new model for IoT test.

 [1]

eNB = Evolved NodeB base station for LTE radio

IMS = IP Multimedia Subsystem

EPC = Evolved Packet Core LTE architecture

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Posted in Top Stories

Advantest Introduces Products for the “Connected World” at SEMICON West 2016

SW1Advantest participated in the annual SEMICON West show at San Francisco’s Moscone Center from July 12-14, 2016, showcasing a broad spectrum of semiconductor test solutions and highlighting a number of new product introductions.  Under the theme, Measure the Connected World … and everything in it, Advantest debuted three new modules for the V93000 single scalable platform.  The new Wave Scale RF and Wave Scale MX cards enable the V93000 to achieve unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal ICs for wireless communications, reducing both the cost of test and time to market.  Additionally, the DC Scale AVI64 universal analog pin module gives the V93000 platform the industry’s broadest capabilities for testing power and analog ICs used in mobile applications.

In its booth, Advantest also highlighted two SoC test solutions – the highly flexible T2000 platform, which gives customers access to high-volume markets with minimal investment, and the EVA100 tester for digital and analog testing of small-pin-count semiconductors.

sw4For customers in the memory IC market, Advantest displayed the high-productivity T5830 memory tester, offering low cost of test for virtually any Flash memory.

A large digital display featured the HA1000 die-level handler for probing individual dies, unpackaged 3D stacks and 2.5D devices.

To meet the needs of the growing solid-state drive (SSD) market, Advantest showcased its MPT3000 system, designed for rapid development and production ramp up of SSD designs.

sw5In addition, Advantest showcased other offerings including the company’s TAS product family of terahertz analysis systems that enable spectroscopic imaging and measurements; nanotechnology E-beam lithography for nano-patterning and MVM-SEM® for nano-scale measurement; the EM360 dashboard, enabling complete test-floor management and planning; the M6245 and M4871 handlers that boost testing productivity; Advantest’s innovative CloudTesting™ Service for on-demand testing; and specialty products such as the MicroLTE portable test system and SmartBox™, a diagnostic test solution for mobile communication devices from W2BI, Inc., an Advantest Group company.

Advantest technologists were also active in technical sessions during SEMICON West. In the Test Vision 2020 program, Derek Floyd presented his paper on “New ATE Solutions for Upcoming Analog Test,” and Dave Armstrong discussed how “Thermal Testing of Singulated Devices Gets Us Closer to Known-Good Die/Stack.”  During the technical session on Analog and New Frontiers, Advantest’s Takahiro Nakajima spoke on “Test Challenges for Future Automotive 100M/1Gbps Ethernet PHY.”

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Posted in Featured Products

Photoacoustic Microscope Furthers Research in Dermatology and Regenerative Science

A new photoacoustic microscope introduced by Advantest enables non-invasive imaging of blood vessels in the dermis to a depth of 3mm, affording researchers in regenerative medicine an alternative to conventional biopsies.  Unlike biopsies – which have shortcomings, including limited insight into changes over time – Advantest’s new Hadatomo photoacoustic microscope offers researchers a thoroughly non-invasive process, with an ability to easily reference and compare historical results. This new evaluation method is poised to contribute to further advances in regenerative medicine, dermatology, and plastic surgery.

microscope

Hadatomo™ Photoacoustic Microscope

Non-Invasive Imaging of Blood Vessels in the Dermis

One important area of research in regenerative medicine is skin grafts and the restoration of blood supply to the transplanted skin. However, even when treatment has restored blood circulation, non-invasive evaluation of results is difficult. Conventional ultrasound is not suited for imaging of blood vessels in the dermis: although it can produce images of areas deep inside the body, its resolution is poor. Conversely, microscopes and other optical imaging tools offer high resolution, but they cannot produce images of deeper dermis areas, as living tissue scatters the light they require.

Photoacoustic imaging combines the propagation characteristics of ultrasound and the absorption characteristics of light into a new hybrid imaging method. By using ultrasound technology, it can obtain accurate information to a depth of several millimeters: hemoglobin selectively absorbs the energy of light and returns ultrasonic waves to the surface of the skin, where they can be captured by sensors. The information obtained can be displayed numerically and as a high-contrast map of blood vessels in the dermis.

microscope2

Principles of Photoacoustic Imaging

Advantest has been developing photoacoustic technology since 2010. The company’s independently developed sensors and electrical circuits permit high-speed measurement without exceeding the MPE (maximum permissible exposure) guidelines for exposure of skin to a light source. The new Hadatomo offers a measurement area of 4 mm × 4 mm × 3 mm (depth) and a maximum speed of 20 seconds per scan. Proprietary algorithms process the data obtained through dedicated software and construct 2D and 3D images in quasi-real time.

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Posted in Featured Products

High Resolution TDR Error Detection for Advanced ICs

Short-pulse Signal Technology Enables 5µm Resolution Fault Isolation to Pinpoint and Map Circuit Defects

Electronic device circuit quality analysis is commonly performed using oscilloscope TDR (time domain reflectometry). However, as devices grow smaller and more highly integrated, the ability to locate failures with extreme spatial precision has become increasingly more important. Existing measurement instruments have limited resolution, as the rise time of the short pulse cannot be compressed much further, creating the risk that existing analysis technologies will be inadequate to handle the requirements of the highly integrated devices on the horizon.
Advantest’s terahertz analysis technology addresses these concerns and meets the need for ultra-high-resolution measurement and analysis of complex electrical circuits by utilizing short-pulse signal technology to enable 5µm resolution fault isolation to pinpoint and map circuit defects.

The company’s new TDR Option for the TS9000 series of terahertz analysis systems enables analysis of circuit quality in semiconductors, printed substrates, electronic components, and other applications, utilizing short-pulse terahertz waves.

ts9000

TS9000 TDR Option probe station

The TS9000 TDR Option relies on Advantest’s market-proven TDR/TDT measurement technology to pinpoint and map circuit defects utilizing short-pulse signal processing. The solution delivers circuit analysis with an extremely high spatial precision of less than 5µm, and a maximum measurement range of 300 mm, including for internal circuitry used in through-silicon vias (TSVs) and interposers. Moreover, with the optional TDR/TDT CAD Data Link, errors located can be mapped and displayed on the CAD data of the target device, making it much easier for users to identify the causes of errors. Three types of TDR/TDT probes, each with a different resolution and measurement distance setting, are available for the TS9000 TDR Option, as are customizations for unique contact requirements.

3d-semiconductor

ts9000-2

3D semiconductor wiring failures and TDR measurement examples

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