November 2017 Issue

TOP STORIES

Scalable Platform Key to Controlling SSD Test Costs

Manufacturers of solid-state drives (SSDs) want to keep test costs under control even as device performance, density, and variety all increase. In addition, the SSD product life cycle is accelerating. Test equipment manufacturers must strike a reasonable balance here. They must provide more capable but less expensive systems that can cover a wider variety of devices. One approach is to make the test system modular and scalable, so companies can buy what they need now and add on later as they need more features and more capabilities.
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Inline Contact Resistance Solves Wafer Probing Challenges

Testing is increasingly being conducted at the wafer level as well as at lower voltage levels, necessitating even greater test accuracy. Achieving this accuracy is often hampered by poor contact resistance (Cres). In this environment, conventional continuity tests – in which current is applied in parallel to all pins and per-pin diode voltage is measured to verify continuity between the tester and the internal die – are not adequate for determining yield limiting contact problem. Moreover, they have no value in determining potential issues with probe card degradation over time.
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A Unique Software Interface for Design and Production

Before device test can take place on automated test equipment (ATE), device-specific test programs need to be developed for the target device and test system. As part of this process, a large amount of digital test content (patterns) gets translated from EDA (design/simulation) to ATE (test) format and needs to be debugged and characterized on the target tester.
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FEATURED HIGHLIGHTS

Advantest’s VOICE 2018 Call for Papers Ends Nov. 17

VOICE, the annual Advantest Developer Conference, has issued an international call for papers for the 2018 event focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and other hot topics. Paper submissions will be accepted through November 17, 2017.VOICE, the annual Advantest Developer Conference, has issued an international call for papers for the 2018 event focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and other hot topics. Paper submissions will be accepted through November 17, 2017.
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FEATURED TECHNOLOGY

W2BI’s New MLT1600 Device Test Automation Platform Addresses LTE, GSM and WCDMA Capabilities for the Burgeoning IoT and Smartphone Markets

W2BI, an Advantest Group company and a global leader in wireless device test automation products for the world’s top wireless operators, suppliers and labs, has introduced the MLT1600 cloud-enabled, device test automation tester as the newest member of its Micro Line Tester portfolio. The MLT1600 addresses the testing challenges of IoT products across multiple cellular radio technologies – such as GSM, WCDMA and LTE – with a 70-MHz to 6-GHz frequency range. With its portable design and small footprint, the MLT1600 leverages W2BI’s existing cloud-based test management platform to acquire on-demand test cases and publish test results as required across all test parameters.
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SPOTLIGHT ON BUSINESS

Advantest Taiwan CEO Guides with Balanced Leadership Approach

The subject of this issue’s Q&A is C.H. Wu, chairman, president and CEO of Advantest Taiwan. Mr. Wu has served in these roles since 2006, and in 2012, he was named an executive officer with Advantest Corporation. He holds a bachelor’s degree in electrical engineering from Taiwan’s Lunghwa University of Science and Technology and an MBA from Saginaw Valley State University in Michigan.
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ADVANTEST NEWS

UPCOMING EVENTS

Please plan to visit or join Advantest at these upcoming events:

SEMICON EUROPA
November 14-17, Munich, Germany
http://www.semiconeuropa.org/

PRODUCTRONICA
November 14-17, Munich, Germany
http://www.productronica.com/index-2.html

MTSA 2017
November 19-23, Okayama, Japan
http://www.ec.okayama-u.ac.jp/~sense/Terahertz/

SEMISRAEL
November 28, Airport City, Israel
https://www.semisrael.com/

GSA AWARDS DINNER
December 7, Santa Clara, CA
https://www.gsaglobal.org/gsa-awards-dinner-celebration-december-7-2017/

SEMICON JAPAN
December 13-15, Tokyo, Japan
http://www.semiconjapan.org/en/?vlang=en

ON THE LIGHTER SIDE…

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